Electronic components in a wide range of shapes and sizes can be tested using a new test fixture from Hioki. Available from MDL Technologies, the IM9202 makes it simple to take reliable high frequency measurements of surface mount and leaded components when using Hioki’s IM7580 range of high-performance impedance analysers.
Use of the versatile fixture makes testing easier, and enables more reliable and repeatable measurements, higher throughput, fewer handling errors and greater measurement accuracy. Its flexibility in use makes it simple to test complex components, with consequent savings in time and costs.
The IM9202 can hold SMDs of irregular shape as well as axial and radial leaded components, including film capacitors and RFID and NFC tags. SMDs from 1.6 mm to 23 mm long can be tested as well as radial components with lead spacings of up to 26 mm.
These types of components are frequently being used in power circuits with switching frequencies above 1 MHz, with standard practice making it necessary to test their characteristics at frequencies above 10 MHz. The IM9202 is suitable for testing at frequencies from 0 to 600 MHz.
“The Hioki IM9202 lets component manufacturers measure devices that are larger than with other test fixtures, while also being more affordable,” said MDL managing director Mark Lucock.
The powerful Hioki IM7580 series impedance analysers for which the fixture is designed are available in five models, providing measurement frequency bands up to 3 GHz. With a half-rack footprint and a palm-sized test head, they offer test speeds as fast as 0.5 ms with a repeatability of 0.07 %.
Applications for the new test fixture include the research and development of large or irregular shape components for use in high power, high frequency circuits, as well as components and antennas for RFID and NFC circuits.