Marvin Test Solutions, Inc., a trusted provider of globally-deployed innovative test solutions for military, aerospace, and manufacturing organizations announced prestigious annual industry awards received by MTS’ Director of Marketing, Mike Dewey, and Business Development Director Mike Frey. Both awards were announced at the 2017 IEEE AUTOTESTCON conference and exhibition in Schaumburg, IL.
Dewey was named the winner of the 2017 Slattery Award by the National Defense Industry Association (NDIA) Systems Engineering Division (SED) Automatic Testing Committee (ATC). Frey was named the 2017 McGinnis award winner by the AUTOTESTCON/IEEE (Institute of Electrical and Electronics Engineers) committee.
The Slattery award honors the memory of John Slattery, an engineer with the General Dynamics Electronics Division and Former Chairman of the MATE Users Group Control and Support Software Committee. It is presented annually to recognize an individual who best characterizes John Slattery’s contributions to the industry, including technical excellence, innovation, and professional contributions to the advancement of the industry, as well as his peers and colleagues.
The Frank McGinnis Award is presented to recognize a career of outstanding leadership, professional management, individual initiative and technical contributions in automated test engineering, as well as active participation in AUTOTESTCON.
Dewey has been an innovator in automatic test technology and instrumentation for over 30 years. He has led engineering innovations in the areas of VXI and PXI for many key companies in the ATE Industry, including GenRad, Teradyne and Marvin Test Solutions (formerly Geotest) and is one of the few people who were instrumental in the creation and development of both card modular, industry standards. His extensive and direct involvement with key ATE industry players and DoD customers has established Dewey as a critical resource for current and new technology innovations.
He holds multiple patents and has written extensively on automatic test topics for publication in industry journals as well as the company’s own online Knowledgebase. Most recently, he led the National Defense Industrial Association (NDIA) Systems Engineering Division (SED) Automatic Testing Committee (ATC) effort for the Field-Programmable Gate Array (FPGA) project.
“Mike Dewey’s exceptional background in the test industry combines unmatched engineering, marketing, and industry participation,” said Loofie Gutterman, president of Marvin Test Solutions. “His focus on solutions that make test easy allows MTS to meet and exceed the expectations of our customers, today and in the future.”
Frey has been a key member of the ATE community for nearly 4 decades, starting with an AF flying career in FB-111A, KC-135, and OV-10A, and holds the distinction of being the first B-1B Avionics Squadron Commander. He was instrumental in bringing B-1B to IOC (Initial Operational Capability) in 1986. In his post-flying Air Force career, he served as Maintenance Supervisor of the largest Integrated Avionics Test facility at Plattsburgh AFB, then as Director of Logistics for B-1B Depot Activation OC-ALC, concluding with 28 years of ATE management and business development working for ATS/ATE organizations including General Dynamics Electronics Division, BAE Systems, Lockheed Martin, EADS North America, and Marvin Test Solutions.
Frey is also an active member of the NDIA Automatic Test Committee and was USAF Liaison for over 18 years.
“Mike Frey’s commitment to working closely with customers has enabled the development of solutions that streamline test and logistics for those who support the warfighter,” said Major General Stephen T. Sargeant, USAF (Ret.), CEO of Marvin Test Solutions. “His knowledge of the industry and end user has been instrumental in advancing creative avionics and armament test systems, and his leadership in the ATE community has helped establish MTS as a leader in the military test solutions market.”
These well-deserved awards represent a first for the event – an unprecedented sweep of both awards by the same company.