Marvin Test Solutions Expands TS-900 Platform

TS-960e Test Platform Features PXI Express Architecture and RF Test Capabilities 


Marvin Test Solutions, a trusted provider of globally deployed, innovative test solutions for military, aerospace, and manufacturing organizations, has expanded the capabilities of  its successful TS-900 PXI semiconductor test platform  with the addition of the TS-960e system which offers PXI Express (PXIe) performance and  expanded test capabilities for RF devices and SoC applications. The TS-960e builds on the integrated open-architecture of the TS-900 platform and accommodates PXIe and PXI modules – providing high-performance digital, mixed-signal, and RF test capabilities in a compact, single chassis footprint.


“Our semiconductor customers asked for an alternative to big-iron ATE systems that would combine the features of high-end ATE with the open architecture and benefits of the PXI standard,” said Steve Sargeant, CEO of Marvin Test Solutions. “With the addition of the TS-960e platform which incorporates our advanced GX5296 digital subsystem, an innovative semiconductor software test suite, and an RF instrumentation option, we are able to offer our customers the flexibility and value of the PXI platform with the high-performance test capabilities typically found only in high-end ATE systems.”


A Performance Test Platform

The TS-960e platform combines 256, 125 MHz digital I/O channels with per-pin-PMU with multiple RF and analog test instruments in a single, 21-slot PXIe chassis. Available as a bench top or with an integrated manipulator, the TS-960e platform takes full advantage of the PXIe architecture to achieve a full-featured test solution for digital, mixed–signal or RF test applications.


High-Performance Digital Test and Comprehensive Software Tools

The GX5296 delivers high-performance digital test capabilities and is ideal for addressing verification, focused production, and failure analysis test needs – or for replacing legacy test systems. The GX5296 builds on the successful GX5295 digital subsystem , offering unrivaled timing, edge-placement, density, memory, and parametric measurement capabilities. When combined with MTS’ advanced semiconductor software suite that includes program development and debug tools, comprehensive file conversion tools for WGL, VCD/eVCD, STIL , and ATP formats, and semiconductor-specific test modules including Shmoo plots and IV curve, the TS-960e provides  no-compromise digital / mixed-signal / RF test capabilities for component, SoC and SiP devices.


TS-960e RF Test Capabilities

The TS-960e is available with Keysight Technologies’ comprehensive portfolio of PXIe RF instrumentation which can address a wide range of RF applications including WLAN, Bluetooth, Cellular, EW, and RF transceivers. Available instrumentation options include Keysight Technologies’ vector transceiver, vector signal analyzers and generators, and vector network analyzer PXIe modules; offering wafer and packaged RF test capabilities from 9 KHz to 27 GHz. All of these modules as well Keysight’s VSA measurement application software are fully integrated with the TS-960e’s system software, ATEasy.




For more information regarding the TS-960e and GX5296, please visit