Farnell invites customers to free webinar on using oscilloscopes and VNAs for EMC debugging, with Rohde & Schwarz

electronics industry newsFarnell, an Avnet Company and global distributor of electronic components, products and solutions, is offering customers access to a free webinar on EMC debugging with oscilloscopes and vector network analysers (VNAs) in partnership with leading Test and Measurement supplier Rohde & Schwarz.

The webinar will take place on 2nd March and will include:

  • Fundamentals of practical EMI/EMC design and troubleshooting of electronic circuits.


  • Explanations on how EMI debugging can be a successful process using state of the art scopes to analyse time and frequency domains of signals from different probes (voltage and current), near field probes, LISN, and antenna.


  • Introduction to the VNA which, for many engineers not familiar with RF design, is an unknown instrument.


  • Practical demonstrations using DC/DC converters and digital electronics to demonstrate the effectiveness of the techniques covered in the webinar.


The schedule for the webinar is:

Tuesday, 2nd March, 2021 – 08.30am – 11.30am GMT

The webinar will be hosted by Arturo Mediano, an electrical engineer and founder of the HF-Magic Lab®, a specialised laboratory for design, diagnostic, troubleshooting, and training in the EMI/EMC/SI and RF fields.

Click here to register.

Rohde & Schwarz is one of the world’s largest manufacturers of electronic test and measurement equipment. Their products set standards in research, development, production and service. Rohde & Schwarz’s solutions are in demand worldwide for signal generation or analysis in labs or production, from audio range right up to the highest microwave frequencies. Rohde & Schwarz offers a broad spectrum of market-leading solutions for the newest technologies including electronics, wireless, RF and microwave applications.

Farnell stocks a broad range of Rohde & Schwarz products including oscilloscopes, RF test equipment and now offers engineers a helpful probe selector tool.