- Radio Communications Test Station MT8000A is All-in-one Measurement Solution to Efficiently Verify 5G BTS RU During Manufacturing —
Anritsu Corporation introduces two software packages that enhance its Radio Communications Test Station MT8000A to support non-signaling RF tests of 5G base stations (BTS). With the Base Station Test Suite for 5G New Radio (NR) millimeter wave (mmWave) MX800045A and Base Station Test Suite for NR sub-6 GHz MX800046A installed, the MT8000A is an all-in-one measurement solution that shortens test times and lowers cost-of-test during manufacturing of 5G BTS radio units (RU).
The MT8000A can conduct measurements that are compliant with 3GPP TS38.141-1
and TS38.141-2 with the software installed. Tests supported include Tx power, frequency error, EVM, TAE, ACLR, OBUE Rx tests, and Rx sensitivity.
The Base Station Test Suites for both NR sub-6 GHz (FR1) and NR mmWave (FR2) support most of the commonly used FR1 & FR2 frequencies globally.
Anritsu has released the two test suites supporting FR1 and FR2 with multiple RF ports to create a more effective solution to conduct RF tests of 5G BTS. The MT8000A, with the software, addresses the increasing market demand for BTS antennas and associated complexities associated with 5G BTS.
The Radio Communications Test Station MT8000A is an all-in-one platform that supports RF, protocol, and other functional tests to verify 5G radios and devices. The new software supports downlink measurements for Tx tests and uplink signal generation for Rx tests in manufacturing environments.
A flexible design allows the MT8000A to conduct highly efficient 5G BTS tests. An easy-to-use GUI allows users to set parameters and view measurement results efficiently and an all-at-once measurement result display allows users to view multiple Tx measurement items simultaneously. It supports Multi-Carrier measurement and measurement results for each component carriers concurrently. With four RF ports, parallel measurements can be performed by the MT8000A, further improving test times, and controlling cost-of-test.