Join Marvin Test Solutions at the International Test Conference

Please join Marvin Test Solutions at the International Test Conference, October 31 – November 2, 2017, at the Fort Worth Convention Center in Fort Worth, TX. You’ll find us in booth #311. To register, visit www.itctestweek.org.

 

We will be exhibiting our flexible, open-architecture, PXI-based functional test solutions, including the new MTEK (Marvin Test Expansion Kit) legacy semiconductor ATE upgrade solution, and the TS-960e PXIe semiconductor test system.

The MTEK Series offers a flexible and scalable add-on solution which can be specifically configured to address a range of test needs for both packaged and wafer test applications. MTEK can be readily integrated with a legacy ATE platform (such as Teradyne, LTX/Credence, and Verigy), providing advanced digital, analog or RF test capabilities.

The TS-960e is supplied with the ATEasy® integrated test development / test executive software suite and all instrument drivers, virtual instrument panels, and a system self-test as well as ICEasy test software tools to facilitate device test development and characterization.

Both the MTEK and TS-960e are available with a comprehensive portfolio of PXI and PXIe instrumentation from MTS as well as RF instrumentation from Keysight Technologies, providing the flexibility to configure the ideal test solution for both current and future test needs.

If you attend ITC this year, please plan to stop by. We look forward to meeting with you to discuss your test challenges and to demonstrate how We Make Test Easy!

 

To arrange a meeting, please contact DarcyO@MarvinTest.com.

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